( ESNUG 293 Item 5 ) ---------------------------------------------- [6/10/98]
Subject: (ESNUG 291 #4 292 #5) Opmaxx's New BIST Test Approach
> I have heard from readers saying that they don't want to "waste" silicon on
> BIST. I have also heard from beleaguered test types that they will spend
> longer developing a test program for an ASIC that the design types spent
> designing it.
>
> Do you suppose that if this situation is true that management will, after
> taking a nanosecond's look at the bottom line, try to reign in designers
> and have them turn out ASICs that are more testable?
>
> - Charles H Small
> Senior Technical Editor
> Computer Design Magazine
From: Cliff Whitmore <cawhitmo@ingr.com>
Charles,
I'm still glad we've stuck with our approach that we documented in your
magazine, pages 83-87, November 1996 -- it is still bearing fruit in terms
of designer productivity and reliable silicon, without degrading
performance.
- Cliff Whitmore
Intergraph Computer Systems
---- ---- ---- ---- ---- ---- ----
From: "Charles H Small" <charles.small@worldnet.att.net>
Cliff:
I just talked to Opmaxx's Bozena (Boh zhen' ah) Kaminska today about their
new BIST product. They use a single technique to test elements of a
mixed-signal design. They design in a test-only feedback path around the
element, let it oscillate, and deduce go/no-go results from the frequency of
oscillation. They are sending me copies of papers they have presented on
this subject.
- Charles H Small
Senior Technical Editor
Computer Design Magazine
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