( ESNUG 289 Item 13 ) ---------------------------------------------- [5/13/98]

From: Victor_Duvanenko@truevision.com
Subject: How Can I Test Embeded RAMs Via The Full SCAN Chain Automagically?

John,

I'm curious if anyone in the chip CAD market can test the embeded RAMs
through the full scan chain.  Are there any EDA products/tools that do this?
Theoretically, you should be able to accomplish this since there are
Flip-Flops all around the RAMs, which the scan chain has complete control
over.  Plus, I don't really care how many vectors it takes, as long as the
process is automagic.

  - Victor J. Duvanenko
    Truevision
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